At the limit of what is possible: Reliable contact probes for finest structures and semiconductor contacts down to 40μm pitch.
Germany
Large variety of contact probes (pogo pins) for contacting PCBs even at difficult contacting conditions, different sizes, tip styles and spring forces available.
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Contacting of all common RF connectors: For frequencies up to 20 GHz, with smart design for highest reliability and easy mounting.
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MµProbe® probe cards are characterized by MEMS contact elements and are particularly suitable for fine pitch full array applications in wafer test.
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Probe card with lamella contact elements, especially suitable for RF applications with a high design variety.
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